SIS PUT | iss. 1 | vol. 30 | 2013 | IEEE Design and Test of Computers

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Main page / Journals / IEEE Design and Test of Computers / 2013 / vol. 30 / iss. 1

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Journal: IEEE Design and Test of Computers | Journal year: 2013 | Journal volume: vol. 30

Number iss. 1

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2013

1.

On deploying scan chains for data storage in test compression environment / Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Design and Test of Computers - 2013, vol. 30, iss. 1, p. 68-76

Scientific article 30

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