Title
Test Sequence-Optimized BIST for Automotive Applications
Authors
[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2020
Chapter type
chapter in monograph / paper
Publication language
english
Keywords
EN
- embedded-test
- logic built-in self-test
- LFSR reseeding
- scan-based testing
- test application time
- test points
Ministry points / chapter
20
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