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Main page / IP outcomes / Selective Per-cycle Masking Of Scan Chains For System Level Test
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Outcome

Title

Selective Per-cycle Masking Of Scan Chains For System Level Test

Creators

[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

PAT number

Z/11/2025

Type of protection law

invention

Submission, granting and maintenance of protection

Outcome protection

Stany Zjednoczone

Submission to the Patent Office

Patent Office submission number

14257918

Patent office submission date

21.04.2014

Country / region

Stany Zjednoczone

Granting and maintaining protection

Protection law number

9377508

Date of obtaining the right

28.06.2016

Country / region

Stany Zjednoczone

Made public date

28.06.2016

System created by Poznań University of Technology and Poznan Supercomputing and Networking Center
Szanowni Państwo,

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