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Main page / IP outcomes / Test-per-clock based on dynamically-partitioned reconfigurable scan chains
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Outcome

Title

Test-per-clock based on dynamically-partitioned reconfigurable scan chains

Creators

[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

PAT number

Z/13/2025

Type of protection law

invention

Submission, granting and maintenance of protection

Outcome protection

Stany Zjednoczone

Submission to the Patent Office

Patent Office submission number

13919974

Patent office submission date

17.06.2013

Country / region

Stany Zjednoczone

Granting and maintaining protection

Protection law number

9335377

Date of obtaining the right

10.05.2016

Country / region

Stany Zjednoczone

Made public date

10.05.2016

System created by Poznań University of Technology and Poznan Supercomputing and Networking Center
Szanowni Państwo,

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