Title
Fault-driven scan chain configuration for test-per-clock
Creators
[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Scientific discipline (Law 2.0)
[2.3] Information and communication technology
PAT number
Z/18/2025
Type of protection law
invention
Submission, granting and maintenance of protection
Outcome protection
Stany Zjednoczone
Submission to the Patent Office
Patent Office submission number
13919998
Patent office submission date
17.06.2013
Country / region
Made public date
18.12.2014
Granting and maintaining protection
Protection law number
9003248
Date of obtaining the right
07.04.2015
Country / region
Made public date
07.04.2015
System created by Poznań University of Technology
and Poznan Supercomputing and Networking Center
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