@INBOOK{Liu2018:i20007, author="{Liu, Yingdi and Mukherjee, Nilanjan and Rajski, Janusz and Reddy, Sudhakar M. and Tyszer, Jerzy}", title="{Deterministic Stellar BIST for in-system automotive test}", year="2018", type="rozdziaƂ w monografii naukowej / referat", language="en", booktitle="{2018 IEEE International Test Conference (ITC)}", publisher="{Institute of Electrical and Electronics Engineers (IEEE)}", doi="10.1109/TEST.2018.8624872", }