Title
The future of design for test and silicon lifecycle management
Authors
[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2024
Published in
Article type
scientific article
Publication language
english
Keywords
Abstract
EN Editor’s notes: Safety-critical applications, such as automotive electronics and data centers, demand high reliability. Integrating design-for-test (DFT) across silicon lifecycle addresses challenges for in-system and in-field operations, which are reviewed in this article. — Mehdi B. Tahoori, Karlsruhe Institute of Technology, Germany
Pages (from - to)
35 - 49
Ministry points / journal
70
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and Poznan Supercomputing and Networking Center
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