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Chapter

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Title

Test Data Encryption with a New Stream Cipher

Authors

[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee | [ SzD ] doctoral school student

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2024

Chapter type

paper

Publication language

english

Keywords
EN
  • hybrid ring generators
  • lightweight additive stream ciphers
  • nonlinear feedback shift registers
  • streaming scan network
  • test data encryption
Abstract

EN Additive stream ciphers (SCs) play a host of roles in securing variety of digital ecosystems. In particular, they can encrypt and decrypt test data used in manufacturing and in-system tests of digital integrated circuits (ICs). In this capacity, SCs have become an essential part of instruments that protect ICs against hardware security threats and mitigate risks associated with an unauthorized access and usage of ICs, possibly due to scan chains. However, many IC vendors keep raising concerns attributable to the complexity of existing SCs in terms of area overhead, performance, impact on a design flow, and test-ability. Here is where this work comes in. It introduces a simple and lightweight, yet effective and scalable, test data stream cipher LANCET developed for the Streaming Scan Network (SSN) technology to decrypt and encrypt the content of the IJTAG communication and the SSN bus. It builds on a hybrid ring generator working in tandem with two nonlinear Galois feedback shift registers to yield a large number of parallel, cryptographically secure pseudorandom keystreams. A comprehensive evaluation, including NIST test suits, show the efficiency of the proposed cipher, and is reported herein.

Pages (from - to)

313 - 322

DOI

10.1109/ITC51657.2024.00052

URL

https://ieeexplore.ieee.org/document/10766693

Book

2024 IEEE International Test Conference, ITC 2024, Proceedings

Presented on

55th IEEE International Test Conference, ITC 2024, 3-8.11.2024, San Diego, United States

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