1.

X-masking for Deterministic In-System Tests / Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2023, vol. 42, iss. 11, p. 4260-4269

Scientific article 100 2,7

2.

LBIST for Automotive ICs with Enhanced Test Generation / Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Łukasz Rybak, Jerzy Tyszer (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2022, vol. 41, no. 7, p. 2290-2300

Scientific article 100 2,9

3.

Autonomous Scan Patterns for Laser Voltage Imaging / Jerzy Tyszer (WIiT), Wu-Tung Cheng, Sylwester Milewski (WIiT), Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka // IEEE Transactions on Emerging Topics in Computing - 2021, vol. 9, no. 2, p. 680-691

Scientific article 140 6,595

4.

X-Tolerant Compactor maXpress for In-System Test Applications with Observation Scan / Yingdi Liu, Sylwester Milewski (WIiT), Grzegorz Mrugalski, Nilanjan Mukherje, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2021, vol. 29, no. 8, p. 1553-1566

Scientific article 100 2,775

5.

Scan integrity tests for EDT compression / Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT) // IEEE Design & Test - 2020, vol. 37, iss. 4, p. 21-26

Scientific article 70 1,527

6.

Star-EDT: Deterministic on-chip scheme using compressed test patterns / Grzegorz Mrugalski, Janusz Rajski, Łukasz Rybak, Jędrzej Solecki, Jerzy Tyszer (WEiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2017, vol. 36, no. 4, p. 683-693

Scientific article 25 2,089

7.

Trimodal scan-based test paradigm / Jerzy Tyszer (WEiT), Grzegorz Mrugalski, Janusz Rajski, Jędrzej Solecki, Chen Wang // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2017, vol. 25, no. 3, p. 1112-1125

Scientific article 30 1,744

8.

Low-Power Programmable PRPG With Test Compression Capabilities / Michał Filipek (WEiT), Grzegorz Mrugalski, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jędrzej Solecki (WEiT), Jerzy Tyszer (WEiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2015, vol. 23, no. 6, p. 1063-1076

Scientific article 30 1,245

9.

Scan test bandwidth management for ultra-large-scale multicore architectures / Wu-Tung Cheng, Yan Dong, Grady Gilles, Yu Huang, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2015, vol. 23, no. 6, p. 1050-1062

Scientific article 30 1,245

10.

Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures / Wu-Tung Cheng, Yan Dong, Grady Gilles, Yu Huang, Jakub Janicki (WEiT), Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2015, vol. 23, no. 6, p. 1050-1062

Scientific article 30 1,245

11.

On deploying scan chains for data storage in test compression environment / Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Design and Test of Computers - 2013, vol. 30, iss. 1, p. 68-76

Scientific article 30

12.

Test Time Reduction in EDT Bandwidth Management for SoC Designs / Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2013, vol. 32, no. 11, p. 1776-1786

Scientific article 25 1,203

13.

EDT Bandwidth Management in SoC Designs / Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2012, vol. 31, no. 12, p. 1894-1907

Scientific article 1,093

14.

High performance dense ring generators / Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Transactions on Computers - 2006, vol. 55, no. 1, p. 83-87

Scientific article 1,426

15.

Ring generators - new devices for embedded test applications / Grzegorz Mrugalski (WE), Janusz Rajski, Jerzy Tyszer (WE) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2004, vol. 23, iss. 9, p. 1306-1320

Scientific article 0,913

16.

2D test sequence generators / Grzegorz Mrugalski (WE), Janusz Rajski, Jerzy Tyszer (WE) // IEEE Design and Test of Computers - 2003, vol. 20, iss. 1, p. 51-59

Scientific article