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Book

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Title

Proceedings of the IEEE International Test Conference 2021

Year of publication

2021

Book type

scientific monograph / conference proceedings

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2021

Number of pages

421

ISBN

978-1-6654-1695-5

DOI

10.1109/ITC50571.2021

URL

https://ieeexplore.ieee.org/xpl/conhome/9611037/proceeding

Chapters
On Reduction of Deterministic Test Pattern Sets (p. 260-267)
Conference

2021 IEEE International Test Conference (ITC), 10-15.10.2021, Anaheim, United States

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