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Article

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Title

Some quantum limits for scaling of electronic devices-estimations and measurements

Authors

[ 1 ] Katedra Systemów Telekomunikacyjnych i Optoelektroniki, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2012

Published in

Metrology and Measurement Systems

Journal year: 2012 | Journal volume: vol. 19 | Journal number: no. 3

Article type

scientific article

Publication language

english

Keywords
EN
  • nanostructure
  • quantum effect
  • integrated circuits
Pages (from - to)

481 - 488

URL

http://www.degruyter.com/view/j/mms.2012.19.issue-3/v10178-012-0041-8/v10178-012-0041-8.xml

Impact Factor

0,982

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