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Article

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Title

Probe capacitance-dependet systematic error in I-V measurements of nanowires: analysis and correction

Authors

[ 1 ] Katedra Systemów Telekomunikacyjnych i Optoelektroniki, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2007

Published in

Metrology and Measurement Systems

Journal year: 2007 | Journal volume: vol. 14 | Journal number: no. 3

Article type

scientific article

Publication language

english

Pages (from - to)

391 - 408

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