Title
Probe capacitance-dependet systematic error in I-V measurements of nanowires: analysis and correction
Authors
[ 1 ] Katedra Systemów Telekomunikacyjnych i Optoelektroniki, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Year of publication
2007
Published in
Article type
scientific article
Publication language
english
Pages (from - to)
391 - 408
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