Title
Detecting anomalies in X-ray diffraction images using convolutional neural networks
Authors
[ 1 ] Instytut Informatyki, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ S ] student | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2021
Published in
Article type
scientific article
Publication language
english
Keywords
EN
- X-ray diffraction image
- multi-label classification
- convolutional neural network
- image recognition
- crystallography
Pages (from - to)
114740-1 - 114740-11
Comments
Article Number: 114740
Ministry points / journal
140
Ministry points / journal in years 2017-2021
140
Impact Factor
8,665
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