Title
23rd IEEE VLSI Test Symposium. 1-5 May 2005, Palm Springs, California. Proceedings
Year of publication
2005
Book type
conference proceedings
Publication language
english
Place
Los Alamitos, United States
Publisher name
Publisher name from the Ministry list
Institute of Electrical and Electronics Engineers (IEEE)
Date of publication
2005
Number of pages
484
ISBN
0-7695-2314-5
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