XXth ISDEIV, XXth International Symposium on Discharges and Electrical Insulation in Vacuum : Proceedings : Tours, France, July 1-5, 2002

doi:10.1109/ISDEIV.2002

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Title

XXth ISDEIV, XXth International Symposium on Discharges and Electrical Insulation in Vacuum : Proceedings : Tours, France, July 1-5, 2002

Year of publication

2002

Book type

conference proceedings

Publication language

english

Place

Piscataway, United States

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2002

Number of pages

681

ISBN

0-7803-7394-4

DOI

10.1109/ISDEIV.2002

URL

https://ieeexplore.ieee.org/xpl/conhome/7977/proceeding

Chapters

Dielectric strength of vacuum contact gap after making current and no-load contact opening (p. 75-78)

Method for vacuum state evaluation based on analysis of dynamic changes of electron field emission current and X-radiation in time (p. 231-234)

Identification of defects in extinguishing vacuum chamber based on analysys of parameters describing PD distributions (p. 543-546)

Transient current international capability of vacuum switching during capacitance switching (p. 580-583)

Late breakdowns in a vacuum interrupter after switching operations (p. 588-591)

Experimental investigation on high-current vacuum arc characteristics (p. 642-645)

Conference

XXth International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV, 1-5.07.2002, Tours, France

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