Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Book

Download BibTeX

Title

Proceedings of the IEEE European Test Symposium 2022

Year of publication

2022

Book type

edited book

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2022

Number of pages

120

ISBN

978-1-6654-6706-3

DOI

10.1109/ETS54262.2022

URL

https://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding

Chapters
X-Masking for In-System Deterministic Test (p. [1]-[6])
Conference

2022 IEEE European Test Symposium (ETS), 23-27.05.2022, Barcelona, Spain

This website uses cookies to remember the authenticated session of the user. For more information, read about Cookies and Privacy Policy.