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Book

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Title

2022 IEEE International Test Conference. ITC 2022. Proceedings

Year of publication

2022

Book type

scientific monograph / conference proceedings

Publication language

english

Publisher name

Institute of Electrical and Electronics Engineers Inc

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2022

Number of pages

686

ISBN

978-1-6654-6270-9

DOI

10.1109/ITC50671.2022

URL

https://ieeexplore.ieee.org/xpl/conhome/9983856/proceeding

Chapters
DIST: Deterministic In-System Test with X-masking (p. 20-27)
Hardware Root of Trust for SSN-based DFT Ecosystems (p. 450-454)
Conference

IEEE International Test Conference ITC 2022, 23-30.09.2022, Anaheim, United States

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