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Book

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Title

Introduction to Quantum Metrology : Quantum Standards and Instrumentation

Authors

[ 1 ] Katedra Systemów Telekomunikacyjnych i Optoelektroniki, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2015

Book type

scientific monograph

Publication language

english

Place

Cham, Switzerland

Publisher name

Springer

Publisher name from the Ministry list

Springer

Date of publication

2015

Number of pages

292

ISBN

978-3-319-15668-2

eISBN

978-3-319-15669-9

Catalog

to201580798

DOI

10.1007/978-3-319-15669-9

URL

https://link.springer.com/book/10.1007/978-3-319-15669-9

Keywords
EN
  • atomic clocks and time scales
  • high accuracy measurements
  • high resolution measurements
  • interferometers and measurements of length
  • measures and standards
  • quantum metrology
  • quantum standards
  • system of units
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