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Book


Title

IEEE European Test Symposium (ETS) 2020

Year of publication

2020

Book type

edited book

Publication language

english

Publisher name

IEEE

Publisher name from the MNiSW list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2020

Number of pages

150

ISBN

978-1-7281-4313-2

eISBN

978-1-7281-4312-5

Chapters
Test Sequence-Optimized BIST for Automotive Applications
Conference

IEEE European Test Symposium (ETS 2020), 25-29.05.2020, Tallinn, Estonia

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