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Chapter


Title

Test Sequence-Optimized BIST for Automotive Applications

Authors

[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2020

Chapter type

chapter in monograph / paper

Publication language

english

Keywords
EN
  • embedded-test
  • logic built-in self-test
  • LFSR reseeding
  • scan-based testing
  • test application time
  • test points
URL

https://doi.org/10.1109/ETS48528.2020.9131585

Book

IEEE European Test Symposium (ETS) 2020

Presented on

IEEE European Test Symposium (ETS 2020), 25-29.05.2020, Tallinn, Estonia

Points of MNiSW / chapter

20.0