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Article


Title

Detecting anomalies in X-ray diffraction images using convolutional neural networks

Authors

[ 1 ] Instytut Informatyki, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ S ] student | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2021

Published in

Expert Systems with Applications

Journal year: 2021 | Journal volume: vol. 174

Article type

scientific article

Publication language

english

Keywords
EN
  • X-ray diffraction image
  • multi-label classification
  • convolutional neural network
  • image recognition
  • crystallography
Pages (from - to)

114740-1 - 114740-11

DOI

10.1016/j.eswa.2021.114740

URL

https://www.sciencedirect.com/science/article/pii/S0957417421001810?via%3Dihub

Comments

Article Number: 114740

Points of MNiSW / journal

140.0

Points of MNiSW / journal in years 2017-2021

140.0

Impact Factor

6.954 [List 2020]

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