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Book

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Title

IEEE European Test Symposium (ETS) 2021

Year of publication

2021

Book type

edited book

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2021

ISBN

978-1-6654-4819-2

eISBN

978-1-6654-1849-2

Chapters
Convolutional Compaction-Based MRAM Fault Diagnosis
Conference

IEEE European Test Symposium (ETS 2021), 24-28.05.2021, Bruges, Belgium

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