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Chapter


Title

Convolutional Compaction-Based MRAM Fault Diagnosis

Authors

[ 1 ] Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2021

Chapter type

chapter in monograph / paper

Publication language

polish

Keywords
EN
  • convolutional compaction
  • DFT
  • fault diagnosis
  • memory built-in self-test
  • MRAM
  • STT-MRAM
DOI

10.1109/ETS50041.2021.9465464

URL

https://ieeexplore.ieee.org/document/9465464

Book

IEEE European Test Symposium (ETS) 2021

Presented on

IEEE European Test Symposium (ETS 2021), 24-28.05.2021, Bruges, Belgium

Points of MNiSW / chapter

20.0