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Book

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Title

17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, Warsaw, Poland, 23-25 April 2014

Year of publication

2014

Book type

edited book

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2014

ISBN

978-1-4799-4560-3

DOI

10.1109/DDECS32181.2014

URL

https://ieeexplore.ieee.org/xpl/conhome/6862738/proceeding

Chapters
Quality assurance in memory built-in self-test tools (p. 39-44)
Conference

17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 23-25.04.2014, Warsaw, Poland

Publication indexed in

WoS (15)

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