Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Book

Download BibTeX

Title

51st ACM/EDAC/IEEE Design Automation Conference (DAC), 2014, San Francisco, CA, 1-5 June 2014

Year of publication

2014

Book type

edited book

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2014

ISBN

978-1-4503-2730-5

URL

https://ieeexplore.ieee.org/xpl/conhome/6877791/proceeding

Chapters
On using implied values in EDT-based test compression (p. 1-6)
Conference

51st ACM/EDAC/IEEE Design Automation Conference (DAC), 2014, 1-5.06.2014, San Francisco, United States

Publication indexed in

WoS (15)

This website uses cookies to remember the authenticated session of the user. For more information, read about Cookies and Privacy Policy.