Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Chapter

Download BibTeX

Title

On using implied values in EDT-based test compression

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2014

Chapter type

paper

Publication language

english

Pages (from - to)

1 - 6

Book

51st ACM/EDAC/IEEE Design Automation Conference (DAC), 2014, San Francisco, CA, 1-5 June 2014

Presented on

51st ACM/EDAC/IEEE Design Automation Conference (DAC), 2014, 1-5.06.2014, San Francisco, United States

Publication indexed in

WoS (15)

This website uses cookies to remember the authenticated session of the user. For more information, read about Cookies and Privacy Policy.