μ-Raman and infrared reflectance spectroscopy characterization of (Lu1-xGdx)2SiO5 solid solution single crystals doped with Dy3+ or Sm3+

M. Bińczyk; M. Głowacki; A. Łapiński; M. Berkowski; Tomasz Runka

doi:10.1016/j.molstruc.2015.12.078

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Title

μ-Raman and infrared reflectance spectroscopy characterization of (Lu1-xGdx)2SiO5 solid solution single crystals doped with Dy3+ or Sm3+

Authors

^{[ 1 ]} Instytut Badań Materiałowych i Inżynierii Kwantowej, Wydział Fizyki Technicznej, Politechnika Poznańska | ^{[ P ]} employee

Year of publication

2016

Published in

Journal of Molecular Structure

Journal year: 2016 | Journal volume: Vol. 1109

Article type

scientific article

Publication language

english

Keywords

EN

Single crystals
rare earth ions
Raman spectroscopy
Infrared reflectance spectra

Pages (from - to)

50 - 57

DOI

10.1016/j.molstruc.2015.12.078

Ministry points / journal

20

Impact Factor

1,753

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