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Book

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Title

22nd IEEE European Test Symposium (ETS 2017 )

Year of publication

2017

Book type

edited book

Publication language

english

Place

New York, USA

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2017

ISBN

978-1-5090-5458-9

eISBN

978-1-5090-5457-2

Chapters
ROM fault diagnosis for O(n(2)) test algorithms
Conference

22nd IEEE European Test Symposium (ETS 2017), 22-26.05.2017, Limassol, Cyprus

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