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Chapter

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Title

ROM fault diagnosis for O(n(2)) test algorithms

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2017

Chapter type

chapter in monograph / paper

Publication language

english

Keywords
EN
  • fault diagnosis
  • GALPAT
  • memory BIST
  • memory test algorithms
  • MISR
  • ROM
DOI

10.1109/ETS.2017.7968229

Book

22nd IEEE European Test Symposium (ETS 2017 )

Presented on

22nd IEEE European Test Symposium (ETS 2017), 22-26.05.2017, Limassol, Cyprus

Ministry points / chapter

20

Publication indexed in

WoS (15)

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