Title
2017 IEEE INTERNATIONAL TEST CONFERENCE (ITC)
Year of publication
2017
Book type
scientific monograph / conference proceedings
Publication language
english
Place
New York, NY, USA
Publisher name
Publisher name from the Ministry list
Institute of Electrical and Electronics Engineers (IEEE)
Date of publication
2017
ISBN
978-1-5386-3414-1
eISBN
978-1-5386-3413-4
Published in
Book series: International Test Conference Proceedings
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