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Book

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Title

IEEE 17th European Test Symposium

Year of publication

2012

Book type

conference proceedings

Publication language

english

Place

Los Almitos, California, United States

Publisher name

IEEE Computer Society

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2012

ISBN

978-1-4673-0697-3

DOI

10.1109/ETS20141.2012

URL

https://ieeexplore.ieee.org/xpl/conhome/6222773/proceeding

Chapters
Bandwidth-aware test compression logic for SoC designs (p. 14-19)
Conference

2012 17th IEEE European Test Symposium, 28.05.2012 - 01.06.2012, Annecy, France

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