Title
2018 IEEE International Test Conference (ITC)
Year of publication
2018
Book type
scientific monograph / conference proceedings
Publication language
english
Place
New York, USA
Publisher name
Publisher name from the Ministry list
Institute of Electrical and Electronics Engineers (IEEE)
Date of publication
2018
ISBN
978-1-5386-8383-5
eISBN
978-1-5386-8382-8
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