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Book

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Title

IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA 2018)

Year of publication

2018

Book type

edited book

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2018

Number of pages

712

ISBN

978-1-5386-7109-2

eISBN

978-1-5386-7108-5

URL

http://toc.proceedings.com/41500webtoc.pdf

Published in

Book series: IEEE International Conference on Emerging Technologies and Factory Automation-ETFA

Chapters
Keyframe-based Local Normal Distribution Transform Occupancy Maps for Environment Mapping (p. 706-712)
Conference

23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 4-7.09.2018, Torino, Italy

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