Title
IEEE 37th VLSI Test Symposium (VTS 2019)
Year of publication
2019
Book type
edited book
Publication language
english
Publisher name
Publisher name from the Ministry list
Institute of Electrical and Electronics Engineers (IEEE)
Date of publication
2019
ISBN
978-1-7281-1171-1
eISBN
978-1-7281-1170-4
System created by Poznań University of Technology
and Poznan Supercomputing and Networking Center
Log in through eKonto to add to SIS