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Chapter


Title

On cyclic scan integrity tests for EDT-based compression

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2019

Chapter type

chapter in monograph / paper

Publication language

english

Keywords
EN
  • E-beam test
  • laser voltage imaging
  • logic BIST
  • repeated scan integrity tests
  • scan cell diagnosis
  • test compression
DOI

10.1109/VTS.2019.8758670

URL

http://ieeexplore.ieee.org

Book

IEEE 37th VLSI Test Symposium (VTS 2019)

Presented on

37th VLSI Test Symposium (VTS 2019), 23-25.04.2019, Monterey, Mexico

Points of MNiSW / chapter

20.0