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Book

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Title

IEEE International Test Conference (ITC 2019)

Year of publication

2019

Book type

scientific monograph / conference proceedings

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2019

Number of pages

561

ISBN

978-1-7281-4824-3

eISBN

978-1-7281-4823-6

Chapters
Test Time and Area Optimized BrST Scheme for Automotive ICs
Conference

IEEE International Test Conference (ITC 2019), 9-15.11.2019, Washington, United States

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