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Main page / Publications / Test Time and Area Optimized BrST Scheme for Automotive ICs
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Chapter

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Title

Test Time and Area Optimized BrST Scheme for Automotive ICs

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2019

Chapter type

chapter in monograph / paper

Publication language

english

Keywords
EN
  • built-in self-test
  • embedded-test
  • functional safety
  • scan-based testing
  • test application time
  • test points
DOI

10.1109/ITC44170.2019.9000133

Book

IEEE International Test Conference (ITC 2019)

Presented on

50th IEEE International Test Conference, ITC 2019, 9-15.11.2019, Washington, United States

Ministry points / chapter

20

Ministry points / conference (CORE)

70

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