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Book

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Title

43rd ACM/IEEE Design Automation Conference : San Francisco, CA, July 24-28, 2006

Year of publication

2006

Book type

conference proceedings

Publication language

english

Place

New York, USA

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2006

Number of pages

1164

ISBN

1-59593-381-6

DOI

10.1109/DAC6238.2006

URL

https://ieeexplore.ieee.org/xpl/conhome/11109/proceeding

Chapters
Test response compactor with programmable selector (p. 1089-1094)
Conference

43rd ACM/IEEE Design Automation Conference, 24-28.07.2006, San Francisco, United States

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