Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Book

Download BibTeX

Title

IEEE International Test Conference ITC 2006 : Santa Clara, 22-27 October 2006

Additional title

EN ITC 2006

Year of publication

2006

Book type

conference proceedings

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2006

ISBN

1-4244-0291-3

eISBN

1-4244-0292-1

DOI

10.1109/ITC10357.2006

URL

https://ieeexplore.ieee.org/xpl/conhome/4079296/proceeding

Chapters
X-press compactor for 1000x reduction of test data (p. 18.1-1-18.1-10)
Conference

IEEE International Test Conference ITC 2006, 22-27.10.2006, Santa Clara, United States

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