Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Chapter

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Title

X-press compactor for 1000x reduction of test data

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2006

Chapter type

paper

Publication language

english

Abstract

EN The paper presents a two-stage test response compactor with an overdrive section and scan chain selection logic. The proposed solution is capable of handling a wide range of X state profiles, offers compaction much higher than the ratio of scan chains to compactor outputs, and provides excellent diagnostic resolution.

Pages (from - to)

18.1-1 - 18.1-10

DOI

10.1109/TEST.2006.297643

URL

https://ieeexplore.ieee.org/document/4079321

Comments

Paper 18.1

Book

IEEE International Test Conference ITC 2006 : Santa Clara, 22-27 October 2006

Presented on

IEEE International Test Conference ITC 2006, 22-27.10.2006, Santa Clara, United States

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