Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Book

Download BibTeX

Title

International Test Conference, 2003. Proceedings. ITC 2003

Year of publication

2003

Book type

conference proceedings

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2003

Number of pages

1572

ISBN

0-7803-8106-8

DOI

10.1109/TEST.2003

URL

https://ieeexplore.ieee.org/xpl/conhome/8970/proceeding

Comments

2 volumes; 1350+222 pages

Chapters
Convolutional compaction of test responses (p. 745-754)
Conference

International Test Conference ITC 2003, 30.09.2003 - 02.10.2003, Charlotte, USA

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