Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Book

Download BibTeX

Title

Proceedings International Test Conference 2002

Additional title

EN ITC International Test Conference 2002

Year of publication

2002

Book type

conference proceedings

Publication language

english

Place

Piscataway, United States

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2002

Number of pages

1255

ISBN

0-7803-7542-4

DOI

10.1109/TEST.2002

URL

https://ieeexplore.ieee.org/xpl/conhome/8073/proceeding

Chapters
Embedded deterministic test for low cost manufacturing test (p. 301-310)
Conference

IEEE International Test Conference ITC 2002, 8-10.10.2002, Baltimore, United States

This website uses cookies to remember the authenticated session of the user. For more information, read about Cookies and Privacy Policy.