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Book

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Title

International Test Conference 2004 : Proceedings

Year of publication

2004

Book type

conference proceedings

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2004

Number of pages

1491

ISBN

0-7803-8580-2

DOI

10.1109/TEST.2004

URL

https://ieeexplore.ieee.org/xpl/conhome/9526/proceeding

Chapters
Fault diagnosis in designs with convolutional compactors (p. 498-507)
Conference

2004 IEEE International Test Conference ITC 2004, 26-28.10.2004, Charlotte, USA

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