Title
Fault diagnosis in designs with convolutional compactors
Authors
[ 1 ] Instytut Elektroniki i Telekomunikacji (IEt), Wydział Elektryczny, Politechnika Poznańska | [ P ] employee
Year of publication
2004
Chapter type
paper
Publication language
english
Abstract
EN The paper introduces a new non-adaptive fault diagnosis technique for scan-based designs. The proposed scheme guarantees accurate and time-efficient identification of failing scan cells based on results of a convolutional test response compaction.
Pages (from - to)
498 - 507
System created by Poznań University of Technology
and Poznan Supercomputing and Networking Center
Log in through eKonto to add to SIS