Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Book

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Title

Proceedings 21st IEEE VLSI Test Symposium

Year of publication

2003

Book type

conference proceedings

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2003

Number of pages

443

ISBN

0-7695-1924-5

DOI

10.1109/VTEST.2003

URL

https://ieeexplore.ieee.org/xpl/conhome/8533/proceeding

Chapters
High speed ring generators and compactors of test data [logic IC test] (p. 57-62)
Conference

21st IEEE VLSI Test Symposium, 01.05.2003, Napa, USA

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