Title
Data Structure in Behavioral Testing of Logical Circuits
Authors
[ 1 ] Katedra Automatyki, Robotyki i Informatyki, Wydział Elektryczny, Politechnika Poznańska | [ P ] employee
Year of publication
2001
Chapter type
paper
Publication language
english
Pages (from - to)
279 - 282
System created by Poznań University of Technology
and Poznan Supercomputing and Networking Center
Log in through eKonto to add to SIS