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Book

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Title

52nd ACM/EDAC/IEEE Design Automation Conference (DAC), San Francisco, CA, 8-12 June 2015

Year of publication

2015

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2015

ISBN

978-1-4503-3520-1

Chapters
Design for low test pattern counts (p. 1-6)
Conference

52nd ACM/EDAC/IEEE Design Automation Conference (DAC), 8-12.06.2015, San Francisco, United States

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