Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Chapter

Download BibTeX

Title

Design for low test pattern counts

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Dziekanat Wydziału Elektroniki i Telekomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2015

Chapter type

paper

Publication language

english

Keywords
EN
  • Design for testability
  • scan-based test
  • test data compression
Pages (from - to)

1 - 6

DOI

10.1145/2744769.2744817

Book

52nd ACM/EDAC/IEEE Design Automation Conference (DAC), San Francisco, CA, 8-12 June 2015

Presented on

52nd ACM/EDAC/IEEE Design Automation Conference (DAC), 8-12.06.2015, San Francisco, United States

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