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Book

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Title

5th International Conference on Surface Metrology, Poznań, April 4-7, 2016 : Book of Abstracts

Year of publication

2016

Publisher name

Comprint Agencja Reklamowa

Date of publication

2016

Chapters
Image processing methods for interferometric shape deviation measurements with sub-micron resolution (p. 147-148)
Conference

5th International Conference on Surface Metrology, 4-7.04.2016, Poznań, Poland

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