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Works title

VLSI testing - test data compression

Authors

Jerzy Tyszer (WIiT) ^{[ 1 ][ P ]}

^{[ 1 ]} Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ P ]} employee

Work ID

r1868_2021

Keywords

PL

VLSI test
test compression
test response compaction
low power test
built-in self-test

Date

04.05.2021

Language

english

Number of pages or volume of work

64

Type of work

educational materials

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